JINR Document Server 127 records found  1 - 15nextend  jump to record: Search took 0.01 seconds. 
1.
28th Conference on the Physics and Chemistry of Semiconductor Interfaces / Rowe, Jack E
2.
<8th>> Symposium on Surface Physics
3.
12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques / Kemerink, Martijin ; Koenraad, Paul M
External link: Conference proceedings e-version
4.
9th International Conference on Scanning Tunneling Microscopy- Spectroscopy and Related Techniques / Behm, R J ; Fuchs, H ; Hörber, J K H ; Wiesendanger, R
5.
Conference on Scanned Probe Microscopies - STM and Beyond / Wickramasinghe, Kumar H
External link: Conference proceedings e-version
6.
5th International Workshop on Beam Injection Assessment of Defects in Semiconductors / Kittler, M ; Breitenstein, O ; Endrös, A ; Schröter, W
7.
27th Annual Conference on the Physics and Chemistry of Semiconductor Interfaces / Rowe, J E
8.
42nd International Field Emission Symposium / Kelly, Thomas F ; Miller, Michael K
9.
29th Annual Conference on the Physics and Chemistry of Semiconductor Interfaces / Aspnes, D E
10.
24th Conference on the Physics and Chemistry of Semiconductor Interfaces / Aspnes, D E
11.
41st International Field Emission Symposium / Blavette, Didier ; Menand, Alain ; Miller, Michael K
12.
Selected proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations / Fesenko, Olena ; Yatsenko, Leonid ; Brodin, Mikhaylo
e-proceeding
13.
25th Annual Conference on the Physics and Chemistry of Semiconductor Interfaces - PCSI-25 / Rowe, J E
14.
21st Conference on the Physics and Chemistry of Semiconductor Interfaces / Aspnes, D E
15.
International Conference on Physics and Chemistry of Molecular and Oxide Superconductors
External link: Conference home page

Haven't found what you were looking for? Try your search on other servers:
recid:35131 in Amazon
recid:35131 in CERN EDMS
recid:35131 in CERN Indico
recid:35131 in CERN Intranet
recid:35131 in CiteSeer
recid:35131 in Google Books
recid:35131 in Google Scholar
recid:35131 in Google Web
recid:35131 in IEC
recid:35131 in IHS
recid:35131 in INSPEC
recid:35131 in INSPIRE
recid:35131 in ISO
recid:35131 in KISS Books/Journals
recid:35131 in KISS Preprints
recid:35131 in NEBIS
recid:35131 in SLAC Library Catalog