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A system for testing strip semiconductor detectors / Gornov, M.G. ; Gurov, Yu.B. ; Dovgun, S.V. ; Morokhov, P.V. ; Sandukovsky, V.G. ; Fateev, A.Yu.

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3 Fateev, A A
1 Fateev, A.A
46 Fateev, A.A.
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