JINR Document Server 2 records found  Search took 0.00 seconds. 
1.
200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics / Jaderstrom, H. ; Murin, Yu. ; Babain, Yu. ; Chubarov, M. ; Pljuschev, V. ; Zubkov, M. ; Nomokonov, P. ; Olsson, N. ; Blomgren, J. ; Tippawan, U. ; et al
e-proceeding
2.

Interested in being notified about new results for this query?
Set up a personal email alert or subscribe to the RSS feed.
Haven't found what you were looking for? Try your search on other servers:
Zubkov, M. in Amazon
Zubkov, M. in CERN EDMS
Zubkov, M. in CERN Indico
Zubkov, M. in CERN Intranet
Zubkov, M. in CiteSeer
Zubkov, M. in Google Books
Zubkov, M. in Google Scholar
Zubkov, M. in Google Web
Zubkov, M. in IEC
Zubkov, M. in IHS
Zubkov, M. in INSPEC
Zubkov, M. in INSPIRE
Zubkov, M. in ISO
Zubkov, M. in KISS Books/Journals
Zubkov, M. in KISS Preprints
Zubkov, M. in NEBIS
Zubkov, M. in SLAC Library Catalog
Zubkov, M. in Scirus