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200 and 300 MeV/nucleon nuclear reactions responsible for single-event effects in microelectronics / Jaderstrom, H. ; Murin, Yu. ; Babain, Yu. ; Chubarov, M. ; Pljuschev, V. ; Zubkov, M. ; Nomokonov, P. ; Olsson, N. ; Blomgren, J. ; Tippawan, U. ; et al
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