/ Instrumentation


Secondary scintillation yield of xenon with sub-percent levels of CO 2 additive for rare-event detection


Henriques, C.A.O. (Coimbra U.) ; Freitas, E.D.C. (Coimbra U.) ; Azevedo, C.D.R. (Aveiro U.) ; González-Díaz, D. (Santiago de Compostela U., IGFAE) ; Mano, R.D.P. (Coimbra U.) ; Jorge, M.R. (Coimbra U.) ; Fernandes, L.M.P. (Coimbra U.) ; Monteiro, C.M.B. (Coimbra U.) ; Gómez-Cadenas, J.J. (Valencia U., IFIC) ; Álvarez, V. (Valencia U., IFIC) ; Benlloch-Rodríguez, J.M. (Valencia U., IFIC) ; Borges, F.I.G.M. (LIP, Coimbra) ; Botas, A. (Valencia U., IFIC) ; Cárcel, S. (Valencia U., IFIC) ; Carríon, J.V. (Valencia U., IFIC) ; Cebrían, S. (Zaragoza U.) ; Conde, C.A.N. (LIP, Coimbra) ; Díaz, J. (Valencia U., IFIC) ; Diesburg, M. (Fermilab) ; Esteve, R. (Valencia, Polytechnic U.) ; Felkai, R. (Valencia U., IFIC) ; Ferrario, P. (Valencia U., IFIC) ; Ferreira, A.L. (Aveiro U.) ; Goldschmidt, A. (LBL, Berkeley) ; Gutiérrez, R.M. (Antonio Narino U.) ; Hauptman, J. (Iowa State U.) ; Hernandez, A.I. (Antonio Narino U.) ; Hernando Morata, J.A. (Santiago de Compostela U., IGFAE) ; Herrero, V. (Valencia, Polytechnic U.) ; Jones, B.J.P. (Texas U., Arlington) ; Labarga, L. (Madrid, Autonoma U.) ; Laing, A. (Valencia U., IFIC) ; Lebrun, P. (Fermilab) ; Liubarsky, I. (Valencia U., IFIC) ; López-March, N. (Valencia U., IFIC) ; Losada, M. (Antonio Narino U.) ; Martín-Albo, J. (Valencia U., IFIC) ; Martínez-Lema, G. (Texas U., Arlington) ; Martínez, A. (Valencia U., IFIC) ; McDonald, A.D. (Texas U., Arlington) ; Monrabal, F. (Texas U., Arlington) ; Mora, F.J. (Valencia, Polytechnic U.) ; Moutinho, L.M. (Aveiro U.) ; Muñoz Vidal, J. (Valencia U., IFIC) ; Musti, M. (Valencia U., IFIC) ; Nebot-Guinot, M. (Valencia U., IFIC) ; Novella, P. (Valencia U., IFIC) ; Nygren, D.R. (Texas U., Arlington) ; Palmeiro, B. (Valencia U., IFIC) ; Para, A. (Fermilab) ; Pérez, J. (Valencia U., IFIC) ; Querol, M. (Valencia U., IFIC) ; Renner, J. (Valencia U., IFIC) ; Ripoll, L. (Girona U.) ; Rodríguez, J. (Valencia U., IFIC) ; Rogers, L. (Texas U., Arlington) ; Santos, F.P. (LIP, Coimbra) ; dos Santos, J.M.F. (Coimbra U.) ; Simón, A. (Valencia U., IFIC) ; Sofka, C. (Texas A-M) ; Sorel, M. (Valencia U., IFIC) ; Stiegler, T. (Texas A-M) ; Toledo, J.F. (Valencia, Polytechnic U.) ; Torrent, J. (Valencia U., IFIC) ; Tsamalaidze, Z. (Dubna, JINR) ; Veloso, J.F.C.A. (Aveiro U.) ; Webb, R. (Texas A-M) ; White, J.T. (Texas A-M) ; Yahlali, N. (Valencia U., IFIC)

Published in: Phys.Lett.
Year: 2017
Vol.: B773
Page No: 663-671
Pages: 9
Year: 2017-10-10 published

Abstract: Xe–CO 2 mixtures are important alternatives to pure xenon in Time Projection Chambers (TPC) based on secondary scintillation (electroluminescence) signal amplification with applications in the important field of rare event detection such as directional dark matter, double electron capture and double beta decay detection. The addition of CO 2 to pure xenon at the level of 0.05–0.1% can reduce significantly the scale of electron diffusion from 10 mm/m to 2.5 mm/m , with high impact on the discrimination efficiency of the events through pattern recognition of the topology of primary ionization trails. We have measured the electroluminescence (EL) yield of Xe–CO 2 mixtures, with sub-percent CO 2 concentrations. We demonstrate that the EL production is still high in these mixtures, 70% and 35% relative to that produced in pure xenon, for CO 2 concentrations around 0.05% and 0.1%, respectively. The contribution of the statistical fluctuations in EL production to the energy resolution increases with increasing CO 2 concentration, being smaller than the contribution of the Fano factor for concentrations below 0.1% CO 2 .

Keyword(s): Double beta decay ; Neutrino ; Rare event detection ; Electroluminescence ; Secondary scintillation ; Xenon

Web-Page: http://inspirehep.net/record/1626912/files/scoap3-fulltext.pdf


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Total numbers of views: 71
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DOI: 10.1016/j.physletb.2017.09.017
 Record created 2017-10-02, last modified 2017-10-02


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