/ Instrumentation


Radiation qualification of the front-end electronics for the readout of the ATLAS liquid argon calorimeters


Buchanan, N.J. (Alberta U.) ; Chen, L. (Alberta U.) ; Gingrich, D.M. (TRIUMF) ; Liu, S. (Alberta U.) ; Chen, H. (Brookhaven) ; Damazio, D. (Brookhaven) ; Densing, F. (Brookhaven) ; Kierstead, J. (Brookhaven) ; Lanni, F. (Brookhaven) ; Lissauer, D. (Brookhaven) ; Ma, H. (Brookhaven) ; Makowiecki, D. (Brookhaven) ; Radeka, V. (Brookhaven) ; Rescia, S. (Brookhaven) ; Takai, H. (Brookhaven) ; Ban, J. (Kosice, IEF) ; Bottcher, S. (Nevis Labs, Columbia U.) ; Boettcher, S. (Nevis Labs, Columbia U.) ; Dannheim, D. (Nevis Labs, Columbia U.) ; Parsons, J.A. (Nevis Labs, Columbia U.) ; Simon, S. (Nevis Labs, Columbia U.) ; Sippach, W. (Nevis Labs, Columbia U.) ; Cheplakov, A. (Dubna, JINR) ; Golikov, V. (Dubna, JINR) ; Golubyh, S. (Dubna, JINR) ; Kukhtin, V. (Dubna, JINR) ; Kulagin, E. (Dubna, JINR) ; Ladygin, E. (Dubna, JINR) ; Luschikov, V. (Dubna, JINR) ; Obudovsky, V. (Dubna, JINR) ; Shalyugin, A. (Dubna, JINR) ; Puzo, P. (Orsay, LAL) ; Richer, J.P. (Orsay, LAL) ; Seguin-Moreau, N. (Orsay, LAL) ; de la Taille, C. (Orsay, LAL) ; Dumont-Dayot, N. (Annecy, LAPP) ; Massol, N. (Annecy, LAPP) ; Le Dortz, O. (Paris U., VI-VII) ; Hubaut, F. (Paris U., VI-VII) ; Laforge, B. (Paris U., VI-VII) ; Martin, D. (Paris U., VI-VII) ; Schwemling, Ph. (Paris U., VI-VII) ; Andrieux, M.L. (LPSC, Grenoble) ; Collot, Johann (LPSC, Grenoble) ; Dzahini, D. (LPSC, Grenoble) ; Hostachy, J.Y. (LPSC, Grenoble) ; Martin, P. (LPSC, Grenoble) ; Brettel, H. (Munich, Max Planck Inst.) ; Cwienk, W. (Munich, Max Planck Inst.) ; Fent, J. (Munich, Max Planck Inst.) ; Jakobs, K. (Munich, Max Planck Inst.) ; Kurchaninov, L. (Munich, Max Planck Inst.) ; Oberlack, H. (Munich, Max Planck Inst.) ; Schacht, P. (Munich, Max Planck Inst.) ; Stiegler, U. (Munich, Max Planck Inst.) ; Battistoni, G. (Milan U.) ; Citterio, M. (Milan U.) ; Sala, P. (Milan U.) ; Cleland, W. (Pittsburgh U.) ; Borgeaud, P. (Saclay) ; de la Broise, X. (Saclay) ; Le Coguie, A. (Saclay) ; Mansoulie, B. (Saclay) ; Pascual, J. (Saclay) ; Dinkespiler, B. (Southern Methodist U.) ; Liu, T. (Southern Methodist U.) ; Stroynowski, R. (Southern Methodist U.) ; Ye, J. (Southern Methodist U.) ; Grahn, K.J. (Royal Inst. Tech., Stockholm) ; Hansson, P. (Royal Inst. Tech., Stockholm) ; Lund-Jensen, B. (Royal Inst. Tech., Stockholm) ; Chu, M.L. (Taiwan, Inst. Phys.) ; Hou, S. (Taiwan, Inst. Phys.) ; Su, D.S. (Taiwan, Inst. Phys.) ; Teng, P.K. (Taiwan, Inst. Phys.)

Published in: JINST
Year: 2008
Vol.: 3
Page No: P10005


Keyword(s): radiation damage to electronic components ; front-end electronics for detector readout ; calorimeters

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