A system for testing strip semiconductor detectors


Gornov, M.G. (Dubna, JINR) ; Gurov, Yu.B. (Dubna, JINR) ; Dovgun, S.V. (Dubna, JINR) ; Morokhov, P.V. (Dubna, JINR) ; Sandukovsky, V.G. (Dubna, JINR) ; Fateev, A.Yu. (Dubna, JINR)

Published in: Instrum.Exp.Tech.
Year: 1996
Vol.: 39
Page No: 513-516

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